OBRABOTKAMETALLOV technology Vol. 24 No. 4 2022 Fig. 2. Thickness of the deposited layer Fig. 3. Microhardness of the deposited layer Results and discussion Properties of the deposited layer The thickness of the deposited layer was determined using a JEOL JSM 7001-F scanning electron microscope and an X-Max-80 Oxford Instruments X-ray fluorescence energy dispersive analyzer (Figure 2). Thickness of the deposited layer varies from 1.36 mm to 1.51 mm and a homogeneous structure with insignificant nonmetallic inclusions in the substrate is observed. The homogeneity of the deposited layer is proven by changes in the microhardness at different depths. The results of microhardness measurements are provided in Figure 3. Cutting force component The operating values of the cutting force were recorded with a signal frequency of 0.1 second. The data were converted in DynoWare and the array of the numerical values of the cutting force was processed in MS Excel. Graphs of the cutting force component Fyz were drawn using built-in functions.
RkJQdWJsaXNoZXIy MTk0ODM1