OBRABOTKAMETALLOV technology Vol. 27 No. 1 2025 a b с Fig. 5. CSLM at 500× magnification: a – a random area of the sample surface after processing in mode No. 1 with a secant line; b – 3D model with a temperature map of heights; c – graph of microrelief variation along the secant line a b Fig. 6. Surface of the specimen made of heat-resistant nickel alloy VV751P after WEDM in mode No. 2, obtained using SEM: a – at 100× magnification; б – at 1,000× magnification
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