OBRABOTKAMETALLOV Vol. 27 No. 1 2025 technology Fig. 9. CSLM at 500× magnification: a – a random area of the sample surface after processing in mode No. 3 with a secant line; b – 3D model with a temperature map of heights; c – graph of microrelief variation along the secant line a b с Fig. 10. CSLM at 500× magnification: a – a random area of the sample surface after processing in mode No. 4 with a secant line; b – 3D model with a temperature map of heights; c – graph of microrelief variation along the secant line a b c
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