OBRABOTKAMETALLOV MATERIAL SCIENCE Том 23 № 3 2021 EQUIPMEN . INSTRUM TS Vol. 7 No. 1 2025 Ta b l e 3 Quality indicators for T4HD protocols Path (m) 0 202 552 840 1375 2010 3061 Rz (μm) 4.704 3.040 3.272 3.396 3.632 5.92 9.274 Ra (μm) 0.609 0.516 0.527 0.532 0.602 0.969 1.69 Fig. 17. Example of the protocol captured on the contour profile recorder T4HD All the roughness measurement results are conveniently summarized in the following table (Table 3). As can be seen in Table 3, both roughness parameters increase with increasing wear. A period of relative stabilization is observed after the second experimental step, followed by a sharp increase in roughness after the sixth step. The graph of the roughness change over time is shown in Fig. 18. Fig. 18. Change in roughness indicators along the cutting path
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