OBRABOTKAMETALLOV MATERIAL SCIENCE Vol. 27 No. 1 2025 particularly in the case of composite materials with non-uniform density distribution, which would limit the analysis depth. A schematic of the experimental setup used for SEM analysis is shown in Fig. 3. Sample images were acquired at various magnifications: 500×, 1,000×, 2,000×, and 5,000×. Lower magnifications were utilized to examine the overall surface morphology and to identify macroscopic defects, such as cracks, pores, and the distribution of reinforcing particles. Higher magnifications were employed to analyze microstructural details, including the interfacial boundary between the PEEK matrix and reinforcing particles, the morphology of individual particles, and micro-defects (micro-cracks, pores) that could negatively affect the mechanical properties of the material. In this study, energy dispersive spectroscopy (EDS) and scanning electron microscopy (SEM) were employed to investigate the microstructural features, surface morphology, and elemental composition of the materials under investigation: pure acrylate (base material), a composite with 5 wt. % PEEK in Acrylate, and a composite with 10 wt. % PEEK in Acrylate [28]. These methods are essential for understanding the distribution of PEEK reinforcing particleswithinAcrylatematrix and for identifying potentialmicrostructural defects that may influence the material’s performance in biomedical applications. Sample preparation for SEM analysis is crucial to obtain high-quality images and reliable data. Samples were sectioned into small fragments of ~10×10 mm to ensure proper accommodation within the SEM chamber. These sections were then subjected to sequential polishing, initially ground with silicon carbide paper of varying grit sizes (from 320 grit for coarse material removal to 1,200 grit for fine polishing). After achieving a smooth surface, diamond paste (3 μm, followed by 1 μm) was used to create a mirror-like finish. This final polishing step is critically important as it reduces surface roughness, which minimizes artifacts during SEM imaging. Energy dispersive spectroscopy (EDS) For detailed elemental analysis of the samples in conjunction with SEM, the energy dispersive X-ray spectroscopy (EDS) method was employed. The EDS method is based on the identification of characteristic X-ray radiation emitted by the sample when it is bombarded with an electron beam from a scanning electron microscope (SEM). The energy of these X-rays is specific to each element present in the sample, enabling their identification and quantification. For a comprehensive assessment of the material composition, EDS analysis was performed in multiple regions of each sample. In particular, point analysis was used to determine the elemental composition in selected local areas, primarily within the reinforcing particles and the PEEK matrix. A schematic of the EDS Instrument is shown in Fig. 4. Fig. 4. Schematic representation of working principle of EDS instrument
RkJQdWJsaXNoZXIy MTk0ODM1