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<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" article-type="research-article" dtd-version="1.2" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">Obrabotka Metallov / Metal Working and Material Science</journal-id><journal-title-group><journal-title xml:lang="en">Obrabotka Metallov / Metal Working and Material Science</journal-title><trans-title-group xml:lang="ru"><trans-title>Обработка металлов (технология • оборудование • инструменты)</trans-title></trans-title-group></journal-title-group><issn publication-format="print">1994-6309</issn><issn publication-format="electronic">2541-819X</issn><publisher><publisher-name xml:lang="en">Новосибирский государственный технический университет</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="publisher-id">462668</article-id><article-id pub-id-type="doi">10.17212/1994-6309-2026-28.3-112-128</article-id><article-id pub-id-type="edn">VARFTC</article-id><article-categories><subj-group subj-group-type="toc-heading" xml:lang="en"><subject>TECHNOLOGY</subject></subj-group><subj-group subj-group-type="toc-heading" xml:lang="ru"><subject>ТЕХНОЛОГИЯ</subject></subj-group><subj-group subj-group-type="article-type"><subject>Research Article</subject></subj-group></article-categories><title-group><article-title xml:lang="en">Evaluation of contact and optical profilometry in the control of the roughness of curved surfaces of machine parts</article-title><trans-title-group xml:lang="ru"><trans-title>Оценка контактной и оптической профилометрии при контроле шероховатости криволинейных поверхностей деталей машин</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-3477-2036</contrib-id><contrib-id contrib-id-type="scopus">57197734041</contrib-id><contrib-id contrib-id-type="researcherid">Q-3875-2018</contrib-id><contrib-id contrib-id-type="spin">6421-3095</contrib-id><name-alternatives><name xml:lang="ru"><surname>Умеров</surname><given-names>Эрвин Джеватович</given-names></name><name xml:lang="en"><surname>Umerov</surname><given-names>Ervin</given-names></name></name-alternatives><address><country country="RU">Russian Federation</country></address><bio xml:lang="en"><p>Ph.D. (Engineering)</p></bio><bio xml:lang="ru"><p>канд. техн. наук</p></bio><email>ervin777@yandex.ru</email><xref ref-type="aff" rid="aff1"/><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-8465-5554</contrib-id><contrib-id contrib-id-type="scopus">55389991900</contrib-id><contrib-id contrib-id-type="researcherid">H-7906-2016</contrib-id><contrib-id contrib-id-type="spin">8087-8998</contrib-id><name-alternatives><name xml:lang="ru"><surname>Соловьев</surname><given-names>Аркадий Николаевич</given-names></name><name xml:lang="en"><surname>Soloviev</surname><given-names>Arkady</given-names></name></name-alternatives><address><country country="RU">Russian Federation</country></address><bio xml:lang="ru"><p>доктор физ.-мат. наук, профессор</p></bio><bio xml:lang="en"><p>D.Sc. (Physics and Mathematics), Professor</p></bio><email>solovievarc@gmail.com</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-4990-9998</contrib-id><contrib-id contrib-id-type="scopus">36853818900</contrib-id><contrib-id contrib-id-type="spin">5398-0153</contrib-id><name-alternatives><name xml:lang="ru"><surname>Егоров</surname><given-names>Юрий Александрович</given-names></name><name xml:lang="en"><surname>Egorov</surname><given-names>Yuriy</given-names></name></name-alternatives><address><country country="RU">Russian Federation</country></address><bio xml:lang="ru"><p>канд. физ.-мат. наук, доцент</p></bio><bio xml:lang="en"><p>Ph.D. (Physics and Mathematics), Associate Professor</p></bio><email>yuriyegorov@cfuv.ru</email><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-0656-7852</contrib-id><contrib-id contrib-id-type="scopus">57204675389</contrib-id><contrib-id contrib-id-type="spin">4471-1007</contrib-id><name-alternatives><name xml:lang="ru"><surname>Скакун</surname><given-names>Владимир Владимирович</given-names></name><name xml:lang="en"><surname>Skakun</surname><given-names>Vladimir</given-names></name></name-alternatives><address><country country="RU">Russian Federation</country></address><bio xml:lang="ru"><p>преподаватель</p></bio><bio xml:lang="en"><p>Lecturer</p></bio><email>vladimir.skakun.92@list.ru</email><xref ref-type="aff" rid="aff1"/><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-1338-9065</contrib-id><contrib-id contrib-id-type="scopus">57217175819</contrib-id><contrib-id contrib-id-type="researcherid">ABA-4188-2020</contrib-id><contrib-id contrib-id-type="spin">5035-5230</contrib-id><name-alternatives><name xml:lang="ru"><surname>Соболевский</surname><given-names>Иван Витальевич</given-names></name><name xml:lang="en"><surname>Sobolevsky</surname><given-names>Ivan</given-names></name></name-alternatives><address><country country="RU">Russian Federation</country></address><bio xml:lang="ru"><p>доктор техн. наук, доцент</p></bio><bio xml:lang="en"><p>D.Sc. (Engineering), Associate Professor</p></bio><email>sobolevskii-ivan@mail.ru</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-3319-3542</contrib-id><contrib-id contrib-id-type="scopus">57204667195</contrib-id><contrib-id contrib-id-type="researcherid">JEZ-9104-2023</contrib-id><contrib-id contrib-id-type="spin">8984-2840</contrib-id><name-alternatives><name xml:lang="ru"><surname>Джемалядинов</surname><given-names>Руслан Марленович</given-names></name><name xml:lang="en"><surname>Dzhemalyadinov</surname><given-names>Ruslan</given-names></name></name-alternatives><address><country country="RU">Russian Federation</country></address><bio xml:lang="ru"><p>заведующий лабораторией</p></bio><bio xml:lang="en"><p>head of laboratory</p></bio><email>rus.dzhemalyadinov@mail.ru</email></contrib></contrib-group><aff-alternatives id="aff1"><aff><institution xml:lang="ru">Крымский инженерно-педагогический университет имени Февзи Якубова</institution></aff><aff><institution xml:lang="en">Crimean Engineering and Pedagogical University named after Fevzi Yakubov</institution></aff></aff-alternatives><aff-alternatives id="aff2"><aff><institution xml:lang="ru">Крымский федеральный университет имени В.И. Вернадского</institution></aff><aff><institution xml:lang="en">V.I. Vernadsky Crimean Federal University</institution></aff></aff-alternatives><content-language>ru</content-language><content-language>en</content-language><volume>28</volume><issue>3</issue><issue-title xml:lang="ru">ТОМ 28, №3 (2026)</issue-title><issue-title xml:lang="en">VOL 28, NO3 (2026)</issue-title><fpage>112</fpage><lpage>128</lpage><history><date date-type="received" iso-8601-date="2026-05-30"><day>30</day><month>05</month><year>2026</year></date></history><permissions><copyright-statement xml:lang="en">Copyright ©; 2026, Umerov E.D., Soloviev A.N., Egorov Y.A., Skakun V.V., Sobolevsky I.V., Dzhemalyadinov R.M.</copyright-statement><copyright-statement xml:lang="ru">Copyright ©; 2026, Умеров Э.Д., Соловьев А.Н., Егоров Ю.А., Скакун В.В., Соболевский И.В., Джемалядинов Р.М.</copyright-statement><copyright-year>2026</copyright-year><copyright-holder xml:lang="en">Umerov E.D., Soloviev A.N., Egorov Y.A., Skakun V.V., Sobolevsky I.V., Dzhemalyadinov R.M.</copyright-holder><copyright-holder xml:lang="ru">Умеров Э.Д., Соловьев А.Н., Егоров Ю.А., Скакун В.В., Соболевский И.В., Джемалядинов Р.М.</copyright-holder><ali:free_to_read xmlns:ali="http://www.niso.org/schemas/ali/1.0/"/><license><ali:license_ref xmlns:ali="http://www.niso.org/schemas/ali/1.0/">https://creativecommons.org/licenses/by/4.0</ali:license_ref></license></permissions><self-uri xlink:href="https://journals.rcsi.science/1994-6309/article/view/462668">https://journals.rcsi.science/1994-6309/article/view/462668</self-uri><abstract xml:lang="en"><p><bold>Introduction.</bold> Roughness measurement of curved machine parts is a critical metrology task, determining the performance characteristics of the components. The contact method introduces systematic error due to the straight-line trajectory of the probe and the plastic deformation of microroughness. Non-contact optical methods eliminate mechanical stress, but their accuracy decreases in areas with a large local inclination angle due to the shadowing effect. The lack of a unified approach to comparing results for curved surfaces limits the ability to tighten tolerances. <bold>The purpose of the work </bold>is to conduct a comprehensive comparative analysis of contact and optical profilometry in measuring the roughness of curved surfaces and to develop mathematical models for correcting systematic errors. <bold>Materials and methods.</bold> Experiments were conducted on samples of 0.45% C steel and GG20 cast iron with curvature radii of 2–25 mm and roughness parameters<bold> Ra</bold> = 0.1–12.5 μm. Contact measurements were performed using a TIME TR200 profilometer, while optical measurements were performed using a Veeco Wyko NT9100 in vertical scanning interferometry and phase shift interferometry modes. Statistical processing included Student's t-test, correlation, and regression analysis. <bold>Results and discussion.</bold> The error of the contact method at a radius of 2 mm reaches +27.6%, at<bold> R</bold> = 25 mm it is no more than +1.4%. The optical method is resistant to curvature, but in areas with high curvature leads to an underestimation of<bold> Ra </bold>by 10–15% due to the shadowing effect. For flat surfaces (<bold>Ra</bold> = 0.8–6.3 μm), there are no significant differences between the methods (<bold>r</bold> = 0.98). Mathematical models have been developed to correct the influence of temperature, contamination, roughness orientation, vibration, and contact force. <bold>Conclusions.</bold> An algorithm for selecting a measurement method is proposed: for radii of curvature less than 10 mm, the optical method with geometric correction is recommended; the contact method is not applicable for radii less than 5 mm. The obtained models can be integrated into the profilometer software for automatic error compensation.</p></abstract><trans-abstract xml:lang="ru"><p><bold>Введение. </bold>Контроль шероховатости криволинейных поверхностей деталей машин – важнейшая метрологическая задача, определяющая эксплуатационные свойства изделий. Стандартизованный контактный метод вносит систематическую погрешность из-за прямолинейной траектории стилуса и пластического деформирования микронеровностей. Бесконтактные оптические методы исключают механическое воздействие, но их точность снижается на участках с большим локальным углом наклона из-за эффекта затенения. Отсутствие унифицированного подхода к сравнению результатов для криволинейных поверхностей ограничивает возможность ужесточения допусков. <bold>Цель работы.</bold> Комплексный сравнительный анализ контактной и оптической профилометрии при контроле шероховатости криволинейных поверхностей и разработка математических моделей коррекции систематических погрешностей. <bold>Методы исследования.</bold> Эксперименты выполнены на образцах из стали 45 и чугуна СЧ20 с радиусами кривизны 2…25 мм и параметром шероховатости Ra = 0,1…12,5 мкм. Контактные измерения проведены профилометром TIME TR200, оптические – на Veeco Wyko NT9100 в режимах вертикальной сканирующей интерферометрии и интерферометрии с фазовым сдвигом. Статистическая обработка включала t-критерий Стьюдента, корреляционный и регрессионный анализ. <bold>Результаты работы.</bold> Погрешность контактного метода при радиусе 2 мм достигает +27,6 %, при R = 25 мм – не более +1,4 %. Оптический метод устойчив к кривизне, но на участках с кривизной приводит к занижению Ra на 10…15 % из-за теневого эффекта. Для плоских поверхностей (Ra= 0,8…6,3 мкм) значимых различий между методами нет (r = 0,98). Разработаны математические модели для коррекции влияния температуры, загрязнений, ориентации неровностей, вибраций и контактного усилия. <bold>Выводы.</bold> Предложен алгоритм выбора метода контроля: при радиусе кривизны менее 10 мм рекомендуется оптический метод с геометрической коррекцией; контактный метод при радиусе менее 5 мм неприменим. Полученные модели могут встраиваться в программное обеспечение профилометров для автоматической компенсации погрешностей.</p></trans-abstract><kwd-group xml:lang="en"><kwd>Contact profilometry</kwd><kwd>Optical profilometry</kwd><kwd>Surface roughness</kwd><kwd>Curved surfaces</kwd><kwd>Error correction</kwd></kwd-group><kwd-group xml:lang="ru"><kwd>Контактная профилометрия</kwd><kwd>Оптическая профилометрия</kwd><kwd>Шероховатость поверхности</kwd><kwd>Криволинейные поверхности</kwd><kwd>Коррекция погрешностей</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Исследование выполнено при финансовой поддержке Российского научного фонда (проект №24-12-20013).</funding-statement><funding-statement xml:lang="en">The research was carried out with the financial support of the Russian Science Foundation (project No. 24-12-20013).</funding-statement><award-group><funding-source><institution-wrap><institution xml:lang="ru">Российский научный фонд</institution></institution-wrap><institution-wrap><institution xml:lang="en">Russian Science Foundation</institution></institution-wrap></funding-source><award-id>24-12-20013</award-id></award-group></funding-group></article-meta><fn-group><fn xml:lang="ru"><p><italic>Финансирование</italic></p> <p>Исследование выполнено при финансовой поддержке Российского научного фонда (проект №24-12-20013).</p></fn><fn xml:lang="en"><p><italic>Funding</italic></p> <p>The research was carried out with the financial support of the Russian Science Foundation (project No. 24-12-20013).</p></fn></fn-group></front><body></body><back><ref-list><ref id="B1"><label>1.</label><citation-alternatives><mixed-citation xml:lang="en">Vinogradova A.A., Grichukha M.I., Smirnova E.E. 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